Item Name : Type E Serial Switch Bit-Error Rate Tester

Interfaces : MIL-STD-1397C Type E

Power : Standard IEC 115 VAC

Control : Front Panel

The XBER-4 Naval Tactical Data System (NTDS) Type E Serial Switch Bit-Error Rate Tester (BERT) tests the quality of transparent switch channels.

The rackmountable FX-4S provides system managers with unprecedented design flexibility to interconnect remote equipment as if it were located in the same laboratory. The unit is designed to cost-effectively meet the unique needs of today's NTDS development, evaluation, and training environments.

FEATURES

• Accurate - 50 Ohm impedance maintained through entire signal path to eliminate reflections & voltage fluctuation
• Full Data Rate - Simultaneous full data rate operation on all Low Level Serial (LLS) channels
• Powerful - Performs direct measurement of the actual biterror rate on LLS channels
• Thorough - Independently tests all four data paths associated with each NTDS LLS channel
• Easy to Operate - Front-panel controls including reset, BERT On/ Off, channel select, LCD backlight illumination and Packet/Bit mode selects
• Easy to Understande - Plain-language status and results display using two 20-character x 4-line LCDs
• Rack Mountable - Ruggedized 2U chassis fits into any standard 19" rack
• Viewable NTDS Signal - Front-panel test points provide access to the NTDS signal lines for detailed analysis